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Encyclopedia of Scanning Electron Microscopy

Name: Encyclopedia of Scanning Electron Microscopy
Brand: NY RESEARCH PRESS
SKU: 12434373
Price: 278.71 BGN
Availability: InStock

Lisa Page

Език

Английски език

Книга С твърди корици

Код Либристо: 12434373

Издателство NY RESEARCH PRESS, януари 2015

This book focuses on various issues concerned with scanning electron microscopy, as well as its theo... Цялото описание

Код Либристо: 12434373

357 b

278.71 лв

Външен склад Изпращаме след 19-25 дни

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This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.