Не ви допада? Няма проблеми! При нас имате възможност за връщане в рамките на 30 дни
Няма да сбъркате с подаръчен ваучер. Получателят може да избере нещо от нашия асортимент с подаръчен ваучер.
30 дни за връщане на стоката
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)§Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations§Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission§Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)§Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions§Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other